Discontinuous Change in the Smectic Layer Thickness in Ferrielectric Liquid Crystals

Authors

V. P. Panov, Trinity College Dublin, Ireland
J. K. Vij, Trinity College Dublin, Ireland
Yuri Panarin, Technological University DublinFollow
C. Blanc, CNRS
V. Lorman, CNRS
J. W. Goodby, University of York

Document Type

Article

Rights

Available under a Creative Commons Attribution Non-Commercial Share Alike 4.0 International Licence

Publication Details

Physical Review E

Abstract

The temperature dependence of the thickness of thick free-standing films is studied using a high-resolution film thickness measurement technique. A small discontinuity in the temperature dependence of the smectic layer thickness at every phase transition between ferro-, ferri-, and antiferroelectric phases is observed. We show that the major contribution to it arises from a change in the smectic tilt angle.

DOI

10.1103/PhysRevE.75.042701

Recommended Citation

Blanc, C. et al. (2007). Discontinuous change in the smectic layer thickness in ferrielectric liquid crystals. Physical Review E vol. 75, pp. 1-4