Document Type
Article
Rights
Available under a Creative Commons Attribution Non-Commercial Share Alike 4.0 International Licence
Abstract
The temperature dependence of the thickness of thick free-standing films is studied using a high-resolution film thickness measurement technique. A small discontinuity in the temperature dependence of the smectic layer thickness at every phase transition between ferro-, ferri-, and antiferroelectric phases is observed. We show that the major contribution to it arises from a change in the smectic tilt angle.
DOI
10.1103/PhysRevE.75.042701
Recommended Citation
Blanc, C. et al. (2007). Discontinuous change in the smectic layer thickness in ferrielectric liquid crystals. Physical Review E vol. 75, pp. 1-4
Publication Details
Physical Review E