A Ratiometric Wavelength Measurement Based on a Silicon-on-Insulator Directional Coupler Integrated Device

Authors

Pengfei Wang, Technological University DublinFollow
Agus Muhamad Hatta, Department of Engineering Physics, Institut Teknologi Sepuluh Nopember, Indonesia
Haoyu Zhao, Key Laboratory of In fiber Integrated Optics of Ministry of Education, Harbin Engineering University, Harbin
Jie Zheng, State Key Laboratory on Integrated Optoelectronics, Jilin University, China
Gerald Farrell, Technological University DublinFollow
Gilberto Brambilla, Optoelectronics Research Centre, University of Southampton, UK

Document Type

Article

Publication Details

https://www.mdpi.com/1424-8220/15/9/21280/htm

Abstract

A ratiometric wavelength measurement based on a Silicon-on-Insulator (SOI) integrated device is proposed and designed, which consists of directional couplers acting as two edge filters with opposite spectral responses. The optimal separation distance between two parallel silicon waveguides and the interaction length of the directional coupler are designed to meet the desired spectral response by using local supermodes. The wavelength discrimination ability of the designed ratiometric structure is demonstrated by a beam propagation method numerically and then is verified experimentally. The experimental results have shown a general agreement with the theoretical models. The ratiometric wavelength system demonstrates a resolution of better than 50 pm at a wavelength around 1550 nm with ease of assembly and calibration.

DOI

https://doi.org/10.3390/s150921280

Recommended Citation

Wang, P., Hatta, A.M. & Zhao, H. (2015). A Ratiometric Wavelength Measurement Based on a Silicon-on-Insulator Directional Coupler Integrated Device. Sensors, vol. 15, pg. 21280-21293. doi:10.3390/s150921280

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.