Application of Phase Shifting Electronic Speckle Pattern Interferometry in Studies of Photoinduced Shrinkage of Photopolymer Layers

Authors

Mohesh Moothanchery, Nanyang Technological University, SingaporeFollow
Viswanath Bavigadda, European Gravitational Observatory, ItalyFollow
Manojit Pramanik, Nanyang Technological University, Singapore
Vincent Toal, Technological University DublinFollow
Izabela Naydenova, Technological University DublinFollow

Document Type

Article

Rights

Available under a Creative Commons Attribution Non-Commercial Share Alike 4.0 International Licence

Disciplines

Optics

Publication Details

Optics Express

doi:10.1364/OE.25.009647

Abstract

Photoinduced shrinkage occurring in photopolymer layers during holographic recording was determined by Phase Shifting Electronic Speckle Pattern Interferometry. Phase maps were calculated from the changes in intensity at each pixel due to the phase differences introduced between object and reference beams. Shrinkage was then obtained from the changes in phase as recording proceeded. The technique allows for whole field measurement of the dimensional changes in photopolymers during holographic recording.

DOI

10.1364/OE.25.009647

Recommended Citation

Moothanchery, M. (2017). Application of Phase Shifting Electronic Speckle Pattern Interferometry in Studies of Photoinduced Shrinkage of Photopolymer Layers. Optical Express, vol. 25, no. 9, pg. 9647-9653. doi: 10.1364/OE.25.009647.